The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 1993
Filed:
Jun. 13, 1990
Yoshiaki Kurata, Ibaraki, JP;
Komori Corporation, Tokyo, JP;
Abstract
A sheet overlapping detecting method includes the following steps. A predetermined level value V.sub.os is set as the level of a light emission signal. On the basis of a value V.sub.ik of a light reception signal obtained upon light reception based on light emission corresponding to a light emission signal having a predetermined level value V.sub.os, an optimum value V.sub.od corresponding to the input value V.sub.k is calculated in accordance with a prestored V.sub.ik -V.sub.od characteristic table. The calculated optimum value V.sub.od is set as the level of the light emission signal to drive the light-emitting device. On the basis of a value V.sub.ik of a corresponding light reception signal, a change value V.sub.1-2 corresponding to the input value V.sub.ik is calculated in accordance with a prestored V.sub.ik -V.sub.1-2 chararcteristic table. A determination level V.sub.L is calculated in accordance with the following equation:
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile