The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1993

Filed:

Dec. 31, 1991
Applicant:
Inventors:

Tomohiro Nakata, Kanagawa, JP;

Akira Mizuta, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ;
U.S. Cl.
CPC ...
356426 ; 250561 ; 356237 ; 356379 ;
Abstract

In a method for inspecting a magnetic disk cartridge, the state, with which an adhesive agent has been applied as an annular layer onto a flange of a center hub in order to adhere a magnetic disk body and the flange of the center hub to each other, is inspected. A collimated light beam is irradiated to a cross section of the layer of the adhesive agent, which cross section is taken in the radial direction of the center hub, from a direction which is parallel to the surface of the flange and which is perpendicular to the cross section of the layer of the adhesive agent. The collimated light beam has a beam diameter such that the whole cross section may be included in the beam diameter. The amount of the collimated light beam, which has passed through the region in the vicinity of the flange, is detected. The area of the cross section of the layer of the adhesive agent is calculated from the detected amount of the collimated light beam, which has passed through the region in the vicinity of the flange. Thereafter, the amount of the adhesive agent, which has been applied onto the flange, is investigated from the results of the calculation.


Find Patent Forward Citations

Nakata, Tomohiro. (1993). Method for inspecting magnetic disk cartridge (U.S. Patent No. 5184197). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5184197

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…