The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 1993
Filed:
Jan. 29, 1991
Hiroshi Nishimura, Kashiwa, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
A method and apparatus for compensating for nonuniformity of a static magnetic field in a MRI system wherein one of X-, Y- and Z-axes of a Cartesian coordinate system is selected as a phase encoding direction, a region of a field of view is selectively excited by applying a high frequency pulse of a predetermined angle to an object under inspection, and an NMR signal is measured by applying a phase encoding gradient magnetic field and a frequency encoding gradient magnetic field after application of the high frequency pulse for a plurality of times while changing the phase encoding gradient magnetic field. A peak value is detected of the measurement data obtained for determining a phase encoding quantity at which the peak value can be obtained, an intensity and a polarity of a linear component of nonuniformity components of the static magnetic field in the direction selected is determined by obtaining an intensity and a polarity of the phase encoding gradient magnetic field corresponding to the peak value, and a pulse sequence for measuring the NMR signal is executed by applying a gradient magnetic field added with a compensating gradient magnetic field having the same intensity as the linear component and a polarity opposite to the linear component to a gradient magnetic field applied in the selected direction.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile