The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 1993
Filed:
Jan. 29, 1991
Applicant:
Inventors:
Assignee:
Institut Dr. Friedrich Forster Pruferatebau, Reutlingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
324225 ; 324238 ; 324262 ;
Abstract
An eddy-current defect test instrument with a rotary head (30) and test probes (32, 34, 36, 38) offset-mounted along a circular track (66) with only one distance probe (40) to achieve compensation for variations in spacing between the probes and the workpiece which only requires one distance signal processing device (60) and only one rotary transmitter (100). This is accomplished by storing the control signals obtained from the distance probe during one revolution of the rotary head (30) and retrieving those control signals associated with the probe position and appropriately modifying a defect signal.