The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1993
Filed:
Jan. 11, 1991
Shigetomo Matsui, Higashiosaka, JP;
Masahiro Uenishi, Akashi, JP;
Sadao Iuchi, Himeji, JP;
Kouji Sugimoto, Kobe, JP;
Kouyu Itoga, Kobe, JP;
Tetsuzo Harada, Akashi, JP;
Kouji Michiba, Kobe, JP;
Katsuhiro Onda, Nagoya, JP;
Takaaki Okumura, Nagoya, JP;
Kawasaki Jukogyo Kabushiki Kaisha, Kobe, JP;
The Chubu Electric Power Co., Inc., Aichi, JP;
Abstract
A radiographic test is conducted on a welded portion of a pipe or the like to form a radiographic image, which is introduced into a computer. Volumetric defects and planar defects in the radiographic image are emphasized and extracted by separate methods to obtain a volumetric candidate defect image and a planar candidate defect image. The candidate defect images are then combined to form a single image in which defects can be easily identified. Features of defects in the images are measured, and a set of interference rules is applied to the measured features. Each inference rule gives a degree of certainty that a defect is of a certain type. The degrees of certainty determined by a plurality of the rules are collated to obtain a total degree of certainty, and the type of a defect is inferred from the total degree of certainty.