The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1993
Filed:
Jun. 29, 1990
Applicant:
Inventors:
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356440 ; 356 39 ; 356336 ; 356410 ; 137 93 ; 137112 ;
Abstract
A sample supply device includes first and second sample supply means for independently receiving respective samples via a common channel and for supplying the samples to an inspection position. The device is controlled so that the second sample supply means performs a sample receiving operation and/or a washing operation with the channel, while the first sample supply means supplies the sample to the inspection position. A sample inspection apparatus inspects the sample at the inspection position principally using an optical method.