The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 1993

Filed:

Jan. 31, 1991
Applicant:
Inventor:

Melvin H Lill, San Jose, CA (US);

Assignee:

FMC Corporation, Chicago, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ;
Abstract

The invention disclosed herein relates to a detection system for a profile line on an observed body which uses a linear array of sequentially energized energy beam emitters to project beams toward the body. Reflections of the beams are detected by a linear array of energy beam receivers which monitor wedge shaped sectors within a field of view. The known sequence of beam projection and the known sector of reception of reflected beams are used to identify points in space on the profile line.


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Lill, Melvin. (1993). Two-dimensional profile detection system (U.S. Patent No. 5182614). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5182614

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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