The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1993
Filed:
Apr. 06, 1991
John D Young, Rexford, NY (US);
Kristina H Hedengren, Schenectady, NY (US);
Donna C Hurley, Albany, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
The invention discloses an inspection system for detecting near surface flaws or defects in conductors using nondestructive eddy current testing suitable for industrial application. The system provides a method and apparatus for acquiring real time, synchronized, discrete eddy current measurement signals from a plurality of sufficiently disposed, spatially correlated eddy current probes then processing and formatting said measurement signals automatically over parallel data channels to accommodate digital processing techniques in order to produce on eddy current image. Utilizing digital image processing provides a capability for improving flaw detection limits while simultaneously enhancing image resolution.