The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1993
Filed:
Mar. 12, 1992
Jae C Schwartz, Santa Clara County, CA (US);
John E Syka, Santa Clara County, CA (US);
John N Louris, Santa Clara County, CA (US);
Finnigan Corporation, San Jose, CA (US);
Abstract
A method of mass analyzing a sample including the steps of defining a trap volume with a three-dimensional quadrupole field for trapping ions within a predetermined range of mass-to-charge ratio, forming or injecting ions within the trap volume such that those within the predetermined mass-to-charge ratio range are trapped within the trap volume, applying a supplementary AC field superimposed on the three-dimensional quadrupole field to form combined fields, scanning the combined fields to eject ions of consecutive mass-to-charge ratio from the trap volume for detection characterized in that the supplementary field has an amplitude just sufficient to eject the ions and that the supplementary field has a beta value below 0.891 and that the combined fields are scanned at a rate so that a length of time corresponding to 200 cycles or more of the supplementary AC field passes per consecutive thomson.