The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 1993

Filed:

Mar. 14, 1990
Applicant:
Inventors:

Makoto Nagao, Hiratsuka, JP;

Keiji Terada, Hiratsuka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 28 ; 382 46 ; 382 53 ; 358107 ;
Abstract

Disclosed is a linear pattern recognizing method of recognizing a linear pattern included in the image data stored in an original image memory. The memory region of the original image memory is divided into a plurality of smaller regions, and the image data of the smaller regions are utilized to obtain projection waveforms at a plurality of projection angles for each smaller region. The projection waveforms thus obtained are analyzed to detect the presence or absence, line direction (.theta.), smaller region. According to the results of detection, a linear segment corresponding to the linear pattern is extracted for each smaller region.


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Nagao, Makoto. (1993). Linear pattern recognizing method (U.S. Patent No. 5181258). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5181258

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