The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 1993
Filed:
May. 30, 1991
Yukio Arima, Tsukuba, JP;
Hiroaki Yanagimoto, Ibaraki, JP;
Yuichi Kunitomo, Tsuchiura, JP;
Tetsuyoshi Tominaga, Ibaraki, JP;
Hitachi Construction Machinery Company, Ltd., Tokyo, JP;
Abstract
An ultrasonic inspection and imaging instrument scans an object under examination, the object having an inspection plane at a predetermined depth, in the direction slanted to the depth (slant scanning), in such a way as to cause rectilinear scanning as viewed from the plane. Measured data on a peak value corresponding to each measurement point obtained from the slant scanning are displayed in the form of a picture on the screen of a display relative to each measurement point. The image displayed on the picturee at that time is most clearly demonstrated, provided an image portion in the vicinity of a test portion corresponding to a test surface is brought into focus in the depth direction. An operator selects the image portion clearly indicated out of the picture displayed on the display, and inputs the position of the image thereon to an input unit, whereby an image processor bases the positional information about the display data thus fed and the relevant information indicating the positional relationship in the depth direction on obtaining the position of the probe in the depth direction when the measured value resulting from the image is collected. The image processor positions the probe there, so that the probe is automatically focused on the test surface.