The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 1993
Filed:
Feb. 24, 1992
Kiyoshi Tsuboi, Tokyo, JP;
Iwatsu Electric Co., Ltd., Tokyo, JP;
Honda Giken Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
A defect detecting method for detecting whether or not an object to be measured has a defect includes the steps of vibrating the object to be measured, picking up the vibration, and detecting that a spectrum of the characteristic vibration of the object to be measured is separated into two portions. Also, a defect detecting apparatus includes a vibrator for vibrating an object to be measured, a vibration detector for picking up a vibration of the object to be measured and for converting the vibration into an electric signal, and computation process and determination equipment for receiving the electric signal from the detector, for analyzing a spectrum of a characteristic vibration of the object to be measured, and for determining whether a defect is present or absent depending on whether a spectrum of a defect of the object to be measured is present or absent.