The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1993

Filed:

Dec. 07, 1989
Applicant:
Inventors:

Koichi Homma, Yokohama, JP;

Akira Kagami, Kawasaki, JP;

Kichizo Akashi, Ebina, JP;

Shigeki Hirata, Kamakura, JP;

Hiroshi Mori, Ebina, JP;

Takayuki Aizawa, Matsudo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395140 ; 395141 ; 364401 ;
Abstract

Method and system for extracting a characteristic from information handled by a computer and displaying the information in a manner to clarify the characteristic. A relationship among information items is analyzed from similarity and cluster analysis, and a characteristic related to the relationship is analyzed and displayed. The present invention is particularly useful in the analysis of merchandise information.


Find Patent Forward Citations

Homma, Koichi. (1993). Method of multi-dimensional analysis and display for a large volume of (U.S. Patent No. 5179643). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5179643

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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