The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1993

Filed:

Feb. 28, 1992
Applicant:
Inventors:

Shintaro Komatani, Osaka, JP;

Shunji Nagao, Kyoto, JP;

Yoshihiro Wakiyama, Kyoto, JP;

Assignee:

Horiba Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 44 ; 378 87 ; 378 88 ; 250374 ;
Abstract

An X-ray analyzer capable of reducing the effects of a shift of peak positions in an energy spectrum resulting from a change in temperature and a lapse of time in an X-ray detector to enable a highly accurate analysis. A shift of peak positions of X-rays from known positions are detected and a voltage applied to a proportional counter is controlled on the basis of the detected results. In addition, a gain in an amplifier amplifying an output from the X-ray detector may be controlled on the basis of the detected results.


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