The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1993
Filed:
Dec. 04, 1991
Charles J Kramer, Rochester, NY (US);
Holotek Ltd., Rochester, NY (US);
Abstract
A dual, simultaneous beam scanning system for simultaneously scanning two individually modulated adjacent scan lines on an internal drum imaging surface uses a deflector which varies the angular orientation between combined orthogonally polarized beams so that one of the beams rotates about the other in synchronism with the angular position (the distance between start of scan) along the scan lines around the drum imaging surface. Signals from both a beam position sensing photodetector array and from a shaft encoder on the deflector unit, such as a Hologon deflector, controls the deflection of one of the orthogonally polarized beams so as to maintain the spacing and prevent crossovers of the adjacent scan lines and also reduce differential bow. Differential bow may be corrected both in the internal drum configuration and in a flat field imaging system using plural beam scanning. The scan lines can overlap so as to provide high resolution imaging at a rate of the order of hundreds of scan lines per second.