The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1993
Filed:
May. 29, 1992
Jerold B Lisson, Henrietta, NY (US);
Victor L Genberg, N. Chili, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for testing or controlling a performance of an adaptive optic. The method includes the steps of generating from the adaptive optic an augmented matrix comprising a local wavefront difference-error sensitivity matrix; and, a local optical quality factor sensitivity matrix; interrogating the adaptive optic by preferentially turning on selected laser sources which are directed into an entrance pupil of the adaptive optic, for recording a resultant diffraction pattern at an imaging plane; taking a Fourier transform of the resultant diffraction pattern, for generating magnitude and phase component at selected pupil positions; laser scanning the entrance pupil of the adaptive optic, for generating up to N samples of magnitude and phase components, thereby forming an observation vector; and solving for a force vector, for applying the force vector to the adaptive optic.