The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1993

Filed:

Sep. 19, 1991
Applicant:
Inventors:

Joseph M Lindacher, Cambridge, OH (US);

Charles K Wike, Jr, Sugar Hill, GA (US);

Assignee:

NCR Corporation, Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G02B / ;
U.S. Cl.
CPC ...
235467 ; 235462 ; 359216 ; 359219 ;
Abstract

A compact optical scanning system includes a rotating polygon having a plurality of curved mirror portions and a plurality of mirror facets, a collection mirror member having a pair of reflective surfaces and a source of scanning light beams which projects the scanning light beams at one of the reflecting surfaces in the collection mirror. By deflecting the scanning light beams off the curved mirror portions, the mirror facets and the pair of reflective surfaces, a single line scan pattern composed of a plurality of single line scan lines each located at a different focal plane will be generated to scan a bar code label. By changing the orientation of the mirror facets together with changing the radius curvature of the curved mirror portions, an axial invariant bow-tie scan pattern composed of multiple scan lines focused at a different focal plane will be generated.


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