The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1993

Filed:

Apr. 07, 1989
Applicant:
Inventors:

Takehiko Kitamori, Hitachi, JP;

Kenji Yokose, Hitachi, JP;

Tetsuya Matsui, Hitachi, JP;

Masaharu Sakagami, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 73 ; 356335 ; 356336 ; 356318 ; 356432 ; 73 2403 ; 73 2801 ; 738655 ; 73601 ; 73643 ; 73 6171 ;
Abstract

This invention relates to an analytical method and a relevant equipment for particulate substances in a sample with the detection of acoustic waves generated in the sample with the irradiation of onto the sample. In this invention, the light power density of the irradiating light onto the sample is set high enough above the breakdown threshold of the particulate substances in the sample, and low enough below the breakdown threshold of the media, and the particulate substances in the sample are counted by detecting the acoustic waves generated by the breakdown of the particulate substances. The particulate substances are also analyzed for their components on the basis of the light signal (emission spectrum) which is detected with a dispersed spectrum from the light which is generated by the breakdown of the particulate substances.


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