The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1993
Filed:
Mar. 22, 1991
Applicant:
Inventors:
Kouichi Ohmori, Toyonaka, JP;
Tetsuro Ohtsuchi, Osaka, JP;
Hiroshi Tsutsui, Yawata, JP;
Sueki Baba, Suita, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 99 ; 378-4 ; 378 54 ; 378 55 ; 378146 ; 378156 ; 378 19 ; 378207 ; 36441313 ; 36441314 ; 36441315 ; 36441317 ;
Abstract
A one dimensional X-ray image sensor consists of a plurality of unit detecting devices aligned in a row and a filter which covers a portion thereof and is made of a material having an X-ray absorption coefficient equal to or nearly equal to that of a target material to be inspected. An X-ray inspection apparatus includes the one dimensional X-ray image sensor and further includes a data processor for correcting measured values using data measured in regard to the filter.