The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1993
Filed:
Apr. 15, 1991
Toru Miyasaka, Hitachi, JP;
Takao Umeda, Mito, JP;
Tetsuya Nagata, Hitachi, JP;
Tatsuo Igawa, Kitaibaraki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An electrostatic recorder including an electrostatic latent image measuring instrument for measuring a state of an electrostatic latent image formed on a photosensitive substance, and executed a printing process until an electrostatic latent image formed on a surface of a photosensitive substance based on measured data is transferred onto a blank form as a visual image by a transfer device by adjusting control factors such as exposure, exposure time, electrostatic charge voltage, development bias, temperature and humidity. The electrostatic latent image measuring instrument is provided with distance sensors which, when a measuring electrode is disposed near to the photosensitive substance, maintains a constant distance therebetween. It is thus possible to measure an electrostatic latent image even if the photosensitive substance is eccentric. Furthermore, an arc between the measuring electrode and the photosensitive substance is prevented by utilizing a gas having a high arc starting voltage between the measuring electrode and the photosensitive substance of the electrostatic latent image measuring instrument.