The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 1993

Filed:

Nov. 25, 1991
Applicant:
Inventors:

Gijsbert Prast, Eindhoven, NL;

Cornelis M Jochem, Eindhoven, NL;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03B / ; C03B / ;
U.S. Cl.
CPC ...
65 111 ; 65-311 ; 65 13 ; 65 29 ; 65158 ; 65160 ; 65DI / ; 356 731 ; 356385 ;
Abstract

In a device for performing measurements on at least partly transparent objects such as optical fibres a radiation beam is directed on the object. The radiation deflected by the object is imaged by means of a lens system (321, 322) on a radiation-sensitive detection system (330). As a result of refraction on interfaces between areas having a different refractive index (311, 312) in the object and between the object and the surroundings (315), dark or light bands corresponding to the projection of the interfaces are produced on the radiation-sensitive detection system (330). Thus measurements can be performed on the internal structure of the object.


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