The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1993
Filed:
Dec. 05, 1990
Dietmar Leeb, Kilchberg, CH;
Ueli Brunner, Dubendorf, CH;
Proceq S.A., Zurich, CH;
Abstract
An apparatus for measuring the surface hardness of building materials, having a housing comprising a test hammer, a driving spring and an impact pin, said test hammer being moveable by means of said driving spring along a path in said housing to be brought to impact against said impact pin, which for measurement is placed on the surface to be measured, and further having measuring device for measuring a rebound height of said test hammer wherein said test hammer is provided with an optical pattern extending over at least part of its length and wherein said measuring device comprises an optical detection unit arranged adjacently to said path of the test hammer and provided for detecting said optical pattern of the test hammer, and wherein said measuring device further comprises an evaluation circuit connected to said optical detection unit to determine the maximum height of the rebounding hammer at the upper end of its path after impact.