The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1992
Filed:
Feb. 22, 1991
Applicant:
Inventor:
Shinichi Dosaka, Tsukui, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359392 ; 359385 ; 359368 ;
Abstract
A microscope apparatus in which an arm and a focusing adjustment are arranged to be detachable with respect to a foot base to make possible to change the length of the arm from an optical axis of an objective provided in the arm and an inner surface of a stand portion of the arm; a height of the arm; a stiffness of the focusing adjustment. In the apparatus according to the invention, since the arm having a different length or a different height and the focusing adjustment having a different stiffness can be selectively adapted to the foot base, it is possible to examine by one apparatus specimens having different dimensions.