The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1992
Filed:
Oct. 15, 1991
John M Fitts, Santa Monica, CA (US);
Electro-Optical Information Systems, Santa Monica, CA (US);
Abstract
This invention relates to an apparatus and method for 3-D vision sensing or measurement to rapidly collect X-Y-Z surface data to support dimensional measurement, surface inspection and Reverse-CAD functions. The high-speed three-dimensional surface measurement system for use in determining the surface of an object from at least two electronic signals, has at least a first source for illuminating at least a surface area of the object with at least one fringe pattern. At least two cameras are provided for receiving reflected illumination from the surface area, each of the at least two cameras have a predetermined spacial orientation relative to the source for illuminating, a primary camera of the two cameras having a line-of-sight that forms a primary angle relative to a line-of-sight of the source for illuminating and a secondary camera of the two cameras having a line-of-sight that forms a secondary angle relative to the line-of-sight of the source for illuminating, the secondary angle being different than the primary angle. The primary camera provides a primary electronic signal representative of reflected illumination received thereby and the secondary camera providing a secondary electronic signal representative of reflected illumination received thereby.