The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 1992

Filed:

Sep. 26, 1990
Applicant:
Inventor:

Takashi Yoshimori, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 731 ; 371 223 ; 371 226 ;
Abstract

A test simplifying circuit is based on a compact test method which is a test method for applying a test pattern series generated from a random pattern generator to a digital circuit to be tested and at the same time for compressing a response output of the to-be-tested circuit by use of a data compactor, and determining the result of data compression. The memory circuits and input/output circuits originally contained in an integrated circuit are used as the random pattern generator and data compactor used for the test, and the random pattern generator and data compactor are reconstructed by the memory circuits and the input/output circuits.


Find Patent Forward Citations

Yoshimori, Takashi. (1992). Test simplifying circuit contained in digital integrated circuit (U.S. Patent No. 5175494). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5175494

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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