The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1992
Filed:
Oct. 11, 1991
Ulf R Langgard, Overland Park, KS (US);
Interconnect Devices, Inc., Kansas City, KS (US);
Abstract
A shielded electrical contact spring probe assembly for testing electrical printed circuit boards includes an outer barrel having an open end and a remote end, an inner core of dielectric material coaxially mounted within the barrel, and an electrical contact spring probe reciprocally seated within an axial bore in the core. A shield surrounds the core between the barrel inner wall and the core and extends the full length of the barrel. A shielding plunger is located in a cylindrical space between the barrel and the shield. The probe assembly remote end is for connection of an electrical transmission line, or in an alternative embodiment, inserting a second electrical contact spring probe within the core. The configuration and material of the core and the shield enable the entire probe assembly to maintain a selected impedance. The electrical contact spring probe seated within the core axial bore includes a separate barrel having a spring seating end and an open end, a compression spring seated in the closed end of the barrel, and a plunger inserted into the barrel. The plunger includes a tail section, connected to a shaft or probe section that protrudes from the barrel and includes the probe tip. The shielding plunger of the assembly is spring loaded to extend outwardly surrounding the probe tip when the probe tip is also in an outwardly extended position. The plunger fits snugly against portions of a circuit board surrounding test site and shields the probe tip against emission of RF energy.