The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 1992

Filed:

Apr. 19, 1991
Applicant:
Inventors:

Soichi Kawasaki, Tokyo, JP;

Takashi Yoshimori, Yokohama, JP;

Keiji Matsumoto, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
307480 ; 3072722 ; 307465 ; 307279 ; 307452 ;
Abstract

A multifunctional scan flip-flop having a normal function and a scan function, including: a first latch used for a normal function for latching input data applied to a data input terminal during a normal function operation, the latch operation being carried out synchronous with a clock applied to a clock input terminal; a second latch used for a scan function for holding scan data applied to a scan data input terminal during a scan function operation; and a delay circuit for delaying one of the input data and the clock relative to the other, the delay operation being carried out in accordance with the H/L level of the scan data held by the second latch.


Find Patent Forward Citations

Kawasaki, Soichi. (1992). Multifunctional scan flip-flop (U.S. Patent No. 5175447). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5175447

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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