The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1992
Filed:
Jun. 21, 1991
Stephen C Jacobsen, Salt Lake City, UT (US);
Clark C Davis, Salt Lake City, UT (US);
Michael G Mladejovsky, Salt Lake City, UT (US);
University of Utah Research Foundation, Salt Lake City, UT (US);
Abstract
Linear displacement and strain measuring apparatus includes a linearly movable element, an emitter disposed on the movable element to move as the element is moved, for developing predetermined paterns of electric fields which vary linearly on the emitter in the direction of movement of the element, and a detector disposed in close proximity to the emitter adjacent the path in which the emitter moves to detect variations in the electric field patterns as the emitter is moved, for producing output signals representing variation in the electric field patterns and thus the linear displacement of the movable element relative to the detector. By attaching the movable element and the detector to spaced apart locations on a specimen, strain in the specimen can be measured.