The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 1992

Filed:

Oct. 28, 1991
Applicant:
Inventor:

Patsy A Ruzzo, West Chester, OH (US);

Assignee:

General Electric Company, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
378 50 ; 378 44 ; 378 48 ;
Abstract

A method for determining the thickness of an aluminide coating deposited on a gas turbine blade using X-ray spectrometry in which the turbine blade is formed from a nickel-based, high temperature alloy. The method establishes a characteristic secondary emission curve based upon the presence of a boundary layer or a layer of nickel permeating into the aluminide coating layer during the coating process. A characteristic secondary emission curve is formed based upon secondary emission characteristic of nickel. One end of the curve is established by a count rate corresponding to secondary radiation from substantially pure nickel and a second end of the curve corresponds to a count rate representative of secondary emission from either the base material or the coating material. The determination of whether to use the base material or the coating material is dependent upon whether the coating is applied by a packed powder process or by chemical vapor deposition and whether the measurements are to be taken in an emission mode or an absorption mode. In either event, the established curve is utilized by an X-ray spectrometry machine to correlate the count rate and fit the measured count rate onto the curve to provide a direct read-out of thickness of the coating.


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