The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 1992

Filed:

Feb. 06, 1990
Applicant:
Inventor:

Joseph F Laukaitis, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356445 ; 2502 / ; 307311 ;
Abstract

A reflection densitometer includes a light source and a photodetector having an output which has a signal component characteristic of the amount of reflected light received from a surface to be measured and a noise component. The noise component of the output is isolated in time by switching the light source on and off so as to create alternating first and second time periods during which the output of the photodetector is characteristic of only the noise component and in which the output of the photodetector is characteristic of both the signal component plus the noise component, respectively. The output of the photodetector during the second time period is subtracted from the output during the first time period to obtain a signal characteristic of only the output of the photodetector characteristic of relected light received. The signal is held constant during the first and second periods by a sample and hold circuit adapted to sample the signal during the second periods and to hold the sampled signal during the first periods.


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