The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1992
Filed:
Mar. 27, 1991
Alan M Nakamura, Torrance, CA (US);
Teresa M Silberberg, Agoura, CA (US);
Michael R Vince, Thousand Oaks, CA (US);
Theodore Carmely, Van Nuys, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
Flaws in an optical fiber are automatically classified as to type by obtaining separate camera images of the fiber illuminated at different angles, and analyzing the images to detect the presence of optical patterns that are characteristic of each different type of flaw. Nominal and actual fiber boundaries are preferably first determined, preferably using noncoherent light, and an initial classification made according to the nature of the differential between the two. An analysis under a side light beam can then be performed to distinguish flaws such as splices, hard versus soft external debris, bubbles, internal debris and uncured buffer. The system reverts to a boundary light analysis to characterize a splice once it has been detected. The boundary analysis is preferably performed with a combination of diffused backlighting transmitted through the fiber, and reflected frontlighting at an angle of about 15.degree.-30.degree. to the fiber axis. The focused beam analysis is preferably performed with a laser beam at an angle of about 15.degree.-45.degree. to the fiber axis.