The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1992

Filed:

May. 06, 1991
Applicant:
Inventors:

Yukio Kashiwabara, Tokyo, JP;

Yukiyoshi Hiraishi, Tokyo, JP;

Eiichi Goto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324142 ; 364483 ;
Abstract

A sampling type measuring device wherein an analog signal is measured by sampling the analog signal, converting each value obtained by sampling into digital form, and then processing the digital values. Exponential averaging calculation is performed directly on the digital values. Thus, no provision or time is needed to regulate the sampling period, thereby shortening the time required to perform measurement.


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Kashiwabara, Yukio. (1992). Sampling type measuring device (U.S. Patent No. 5170115). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5170115

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