The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1992

Filed:

Jan. 16, 1991
Applicant:
Inventors:

Willem D Van Amstel, Eindhoven, NL;

Joseph L Horijon, Eindhoven, NL;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250235 ; 250561 ;
Abstract

An optical scanning device comprises an optical system for imaging a part of the surface (10) to be scanned on the detection system (22-25; 122-125). The optical system comprises an objective system (43) and two cylindrical lenses (41, 42) and/or two systems of cylindrical mirrors (141a, 141b, 142a, 142b). In the direction in which the cylindrical lenses (41, 42) have their optical power, the objective system (43) functions as an imaging lens so that a light-intensive and spatial image of the surface is formed at the detection system (22-25). Due to the achieved large numerical aperture, the image formed can also be observed three-dimensionally so that information about the profile of the surface can be obtained by means of the scanning device.


Find Patent Forward Citations

Van Amstel, Willem. (1992). Scanning device for optically scanning a surface along a line (U.S. Patent No. 5170037). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5170037

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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