Solid state imaging device having a defect relief system

Abstract

A solid state imaging device composed of a plurality of photo-diodes each of which having a P-N junction. A P-N junction which corresponds to that of a faulty picture cell is destroyed through use of a high energy beam irradiation, such as a laser. Signal data corresponding to that of the destroyed picture cell is detected through use of a voltage comparator which outputs a signal indicative of either a preceding picture cell or that corresponding to a picture cell of a preceding row of picture cells. This system can be used for specific address information. In accordance with the imaging device the defective pixel (picture cell) information appearing in the output signal of the matrix array of photo-diodes, which is at a correspondingly different level from that of ordinary read signals, is detected by a voltage detection circuit and the relief of the defective pixels can be implemented through use of circuits which form the preceding pixel signal information or the pixel signal information corresponding to that of a preceding row. As to implementing the system in connection with a specific address information, the defective pixel signal can also be used as a specific mark representing the display position thereof.