The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 1992
Filed:
Jan. 29, 1991
Masao Yamawaki, Itami, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
An imaging device for measuring the three-dimensional configuration of an object includes a mask having two optical windows, a lens which receives light which has passed through the windows, and an imaging element which receives the light collected by the lens. In addition, color filters having different spectral transmittance characteristics are provided on the two optical windows of the mask and another color filter having portions with spectral transmittance characteristics corresponding to the respective spectral transmittance characteristics of the filters on the windows is provided on the imaging element. A shutter for controlling the respective light transmissivities of the two optical windows of the mask may be provided alternatively or in conjunction with the filters to control the transmissivities of the windows, especially in synchronization with scanning of the imaging element across the light beams from the windows.