The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 1992

Filed:

Mar. 26, 1991
Applicant:
Inventors:

Ronald D Wertz, Boulder, CO (US);

Stephen M Horacek, Louisville, CO (US);

H Kent Minet, Littleton, CO (US);

Robert Cormack, Boulder, CO (US);

Assignee:

Ball Corporation, Muncie, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73627 ; 73634 ;
Abstract

An apparatus and method for inspecting multilayer articles. An article to be inspected is clamped in a liquid filled tank between a pair of focused transducers. An ultrasonic pulse is introduced to a cross section of the article from each transducer sequentially. Reflections from the surfaces and interfaces within the article are received by each transducer and transmitted to a computer for analysis. The thicknesses of the innermost layers of the article are determined by calculating the mean of the measurements from each transducer for each inner layer.


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Wertz, Ronald. (1992). Nondestructive inspection system for laminated products (U.S. Patent No. 5167157). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5167157

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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