The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1992
Filed:
Aug. 23, 1991
Yuji Kobayashi, Shizuoka, JP;
Tamiki Takemori, Shizuoka, JP;
Tsutomu Hara, Shizuoka, JP;
Naohisa Mukohzaka, Shizuoka, JP;
Narihiro Yoshida, Shizuoka, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
An object is typically illuminated by laser light, and reflected light carrying a speckle pattern is amplified by an image intensifier. First and second speckle patterns representing the object before and after its deformation, respectively are written by double writing into a ferroelectric liquid crystal spatial light modulator (FLC-SLM). The double-written image is read out from the FLC-SLM, and converted by a Fourier transform optical system into an output optical image, i.e., Young's fringe. The output optical image is detected by a photoelectric converter, and analyzed by an image processing device to determine a deformation of the object.