The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1992
Filed:
Oct. 17, 1990
Applicant:
Inventor:
Ippei Takahashi, Minami-ashigara, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; H01J / ;
U.S. Cl.
CPC ...
250563 ; 250560 ; 250236 ; 356431 ;
Abstract
A surface inspecting apparatus generates an inspecting width gate signal by in a procedure wherein when the subject matter is subjected to the scanning via the light beam, a counting means digitizes the detected position of both the front and rear ends of the subject and then an operating means calculates values which indicate the positions included within the range between both of the ends, thus generating the inspecting width gate signal. Consequently, it is possible to inspect any subject matter without manually resetting the effective inspecting range whenever a subject matter changes in width.