The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1992

Filed:

Jan. 16, 1991
Applicant:
Inventors:

Hans-Dieter Strater, Frankfurt am Main, DE;

Daniel Gross, Carouge, CH;

Karl M Jauch, Le Lignon, CH;

Assignee:

Battelle-Institut e.V., Frankfurt am Main, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ; G01B / ; G01J / ;
U.S. Cl.
CPC ...
356-4 ; 2502014 ; 2502018 ; 356372 ; 356375 ; 356376 ;
Abstract

The method serves for measuring the profile of a rough, reflecting surface as a function of the distance between each point of this profile and a polychromatic light source. This object is reached, e.g., by forming a flat light bundle from the light of this source and imagining it on the profile by means of a chromatic lens element. This leads to a light band of different colors, which indicate the profile contour. Analysis by means of a spectral-dispersive apparatus reconstructs the contour profile of the object.


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