The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1992

Filed:

Aug. 29, 1990
Applicant:
Inventors:

Eiji Ogino, Tenri, JP;

Shigeki Imai, Nara, JP;

Masahiko Wada, Tenri, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 36518907 ;
Abstract

An integrated circuit having a memory capable of being tested protects data stored in the memory from being read out of the integrated circuit during testing. Data input during memory testing is internally compared with data stored in the memory. The integrated circuit also outputs the accumulated comparison results. The output comparision result also may differ from the data in timing. An input unit includes an external terminal and a plurality of buffers for controlling data input and output to and from the integrated circuit.


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Ogino, Eiji. (1992). Integrated circuit (U.S. Patent No. 5164918). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5164918

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