The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1992

Filed:

Feb. 10, 1992
Applicant:
Inventors:

Haruhiko Sakurai, Sayama, JP;

Toshiaki Higashi, Kitakyushu, JP;

Toshihiko Satoh, Tokyo, JP;

Yutaka Tomita, Yokohama, JP;

Kohki Isago, Yokohama, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
3644133 ; 36441303 ; 128696 ; 73 3102 ;
Abstract

A device for measuring a rate exposed to deleterious materials comprises a heartbeat sensor for sensing heart rates, a deleterious material sensor for sening concentrations of deleterious materials in the air, a memory for storing the conversion values for converting the heart rates into corresponding respiration rates, and an operation unit. The operation unit counts a heart rate based a heartbeat signal received from the heartbeat sensor, calculates a respiration rate corresponding to the heart rate based on a conversion value read out from the memory, and calculates a rate exposed to deleterious material per unit time based on the calculated respiration rate and a signal respresenting a concentration of the deleterious material which signal is received from the deleterious material sensor.


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