The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1992

Filed:

Sep. 09, 1991
Applicant:
Inventors:

Frank M Caimi, Vero Beach, FL (US);

Barry G Grossman, Satellite Beach, FL (US);

Ali T Alavie, Toronto, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
25022717 ; 73800 ;
Abstract

A systems for measuring the value of a plurality of parameters includes an optical fiber having a core that conducts coherent light along two orthogonal polarization axes at different velocities, e.g., an elliptical core, a light source for launching linearly polarized coherent light into such fiber to propagate therein as multimodes, a light splitter to divide the light that emerges from the optical fiber into a plurality of light portions, a mode stripper to remove the second order mode of light from the first light portion, a first polarizer to polarize such first light portion after it exits the mode stripper, a first photodetector to convert the polarized first light portion into a first electric signal, second polarizer to polarize a second light portion, a second photodetector to convert the polarized second light portion into a second electric signal, a signal processor to convert the first and second electric signals into a pair of analog voltages, and meters or the like to display such voltages as parameter values, e.g., strain and temperature. The systems may include a third polarizer and third photodetector to process a third light portion for a third parameter measurement, e.g., pressure. Parameter value measurement methods using the new systems are disclosed.


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