The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1992
Filed:
Dec. 14, 1990
Carl G Witthoft, Acton, MA (US);
Allan Wirth, Bedford, MA (US);
Lawrence E Schmutz, Watertown, MA (US);
Theresa L Bruno, Bedford, MA (US);
Bruce W Baran, Lexington, MA (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
An improved two-dimensional optical centroid processor ('OCP') wavefront sensor is described in which a scanning mirror 146 scans the wavefront of input light 130 to provide a scanned beam 148 (i.e. a portion of the wavefront). The scanned beam 148 is focused on an OCP 168 filter comprising four rows of mask cells. The filtered light emanating from the cells impinges on one-dimensional photodetector devices 192, 198, 202, 206 (i.e. photodetector rows). Thus, the scanning of the wavefront by the scanning mirror provides two-dimensional measurement while employing one-dimensional photodetector devices. Each of the photodetector devices provides an output to a ratio calculator 201 which is used to correct the tilt in the wavefront by driving a deformable mirror (not shown).