The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1992
Filed:
Jan. 18, 1991
Hans Raasch, Monchengladbach, DE;
Wilhelm Oehrl, Erkelenz, DE;
W. Schlafhorst Ag & Co., Monchengladbach, DE;
Abstract
A method for cleaning the measuring chamber of a contactlessly operating scanner head of an apparatus for monitoring yarns on a textile machine includes bringing a cleaning tool formed of an elastic material from a waiting position into an operating position. The cleaning tool is mechanically brought to walls of the measuring chamber for a cleaning operation. The elastic material cleaning tool is adapted to the contour of the measuring chamber during the cleaning operation by positioning the cleaning tool. The measuring chamber is mechanically cleaned without yarn being disposed in the measuring chamber. The cleaning tool is taken out of operation and returned to the waiting position after the cleaning operation. An apparatus for cleaning the measuring chamber includes a mechanically operating cleaning tool being formed of an elastic material and having a contour. The cleaning tool is brought from a waiting position into an operating position in the measuring chamber for performing a cleaning operation while adapting the contour of the elastic material cleaning tool approximately to the contour of the measuring chamber.