The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1992
Filed:
Dec. 06, 1990
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
Automatic particle pattern judging method, in which particles to be tested, such as blood cell particles, are delivered into not only a reaction vessel but also a reference vessel, and an amount of the particles delivered into the reference vessel is measured and a judgement whether the particle pattern formed in the reaction vessel is agglutinated or not is conducted by correcting values of a reaction liquid contained in the reaction vessel concerning parameters for the judgement or correcting threshold values, with which the values of the test liquid concerning the parameters should be compared in accordance with the amount of the particles delivered into the reference vessel. Therefore, by the method according to the invention, even when the amount of particles to be tested delivered into the reaction vessel is varied for some reason, it is possible to judge correctly whether the particle pattern is agglutinated or not.