The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 1992

Filed:

Jul. 24, 1989
Applicant:
Inventors:

Jodie A Christner, Minnetonka, MN (US);

Rajiv Ranjan, Edina, MN (US);

Assignee:

Magnetic Peripherals Inc., Minneapolis, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01F / ; H01F / ;
U.S. Cl.
CPC ...
428611 ; 428652 ; 428667 ; 428668 ;
Abstract

A magnetic thin film recording medium is provided for longitudinal recording of magnetic flux transitions, with the read-back signals enhanced due to a substantial reduction in media noise. The reduced noise level is the result of a unique vacuum deposition process for applying an underlayer to a substrate, prior to deposition of the magnetic thin film. In particular, the underlayer is deposited in a low temperature plasma process under increased pressure of argon or another inert gas and at reduced deposition rates, thus to create voids or interstitial areas which substantially isolate individual grains from their neighboring grains. The subsequently deposited magnetic thin film replicates the crystalline structure and orientation of the chromium underlayer, for relatively isolated grains in the recording layer. This results in lower media noise levels, approaching or equalling those characteristic of particulate media.


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