The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1992

Filed:

Jan. 04, 1990
Applicant:
Inventors:

Akino Inoue, Kawasaki, JP;

Isao Hoshino, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 4423 ; 369 4424 ; 369 4442 ; 369112 ; 2502015 ;
Abstract

In an apparatus for detecting a focusing error of an objective lens, a light beam reflected from an optical disk passes the objective lens and is reflected from a beam splitter. The reflected light beam is incident on a cylindrical lens so that the light beam is converged in one direction by the cylindrical lens. The converged light beam is incident on first and second triangular prisms so that it is divided into two beams and the two beams are guided into different directions and form beam spots on photo-detectors, respectively. In the respective triangular prism, light rays of the light beam pass through different optical paths. Thus, an aberration is applied to the light beam from the prisms. Accordingly, the shape of each beam spot on the photo-detector is changed in accordance with a focusing error.


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