The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1992
Filed:
Jun. 26, 1990
Fumiaki Teshima, Otawara, JP;
Katsuhiro Inoue, Yokohama, JP;
Kaoru Kurebayashi, Yokohama, JP;
Yukihiro Mihara, Kawasaki, JP;
Takuya Kishimoto, Kamakura, JP;
Kabushiki Kaisha Toshiba, Kanagawa, JP;
Abstract
A system test apparatus for verifying whether or not a tested system works according to particular specifications is disclosed. The system test apparatus comprises a storage device for storing the particular specifications as a finite state machine model including elements represented with time sections which may take place, a detecting device for periodically detecting operation information which represents an operation of the tested system as a combination of events and actions represented with the time sections which may take place and a verification device for comparing the operation information with the particular specifications stored in the storage device according to the finite state machine model. In the above finite state machine model, events, actions, and the like are represented with time sections which may take place.