The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1992

Filed:

Oct. 03, 1991
Applicant:
Inventors:

Joel A Cohen, Shaker Heights, OH (US);

R Craig Virnelson, Chesterland, OH (US);

Assignee:

Tremco Incorporated, Cleveland, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
250339 ; 250341 ; 356346 ;
Abstract

An FT-IR spectrometer (10) operated for analysis by reflectance spectroscopy, has a window (56) having a body (58) which generally transmits radiation in the visible range there through. The window has a surface (60) for supporting a sample (72) of material to be analyzed. The surface of the window has a coating (62) that generally transmits visible radiation while generally reflecting radiation across the infrared range. The window provides for fast and reliable set up of sample and background scans through use of a visual microscope portion of the spectrometer. The window also has a long life, is durable and is low in cost.


Find Patent Forward Citations

Cohen, Joel. (1992). Ft-ir spectrometer window and method (U.S. Patent No. 5160826). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5160826

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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