The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1992

Filed:

Sep. 24, 1991
Applicant:
Inventors:

Toshiyuki Takeda, Tokyo, JP;

Satoshi Matsuura, Tokyo, JP;

Akio Ichikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 731 ;
Abstract

An optical fiber testing apparatus for testing an optical fiber as to presence and location of a fault such as breakage by inputting a pulsed coherent light beam to the optical fiber and synthesizing a return light beam reflected back from the optical fiber with a reference light beam having a frequency deviated from the pulsed light beam by a predetermined amount, wherein the synthesized waveform is detected through optical heterodyning. The electric signal obtained from the heterodyning detection is detected by an envelope detector, of which dynamic range is effectively virtually broadened by using correcting data prepared previously. The optical fiber test can be accomplished through a single measurement without involving expensiveness of hardware.


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